Materials Analysis Services | Semiconductor & Electronic Component Testing

Energy Dispersive X-ray Spectroscopy (EDS) is a powerful tool we use to reveal what your components are really made of. By pairing it with high-resolution electron microscopy, we can pinpoint and measure the elements present in your sample—down to microscopic areas. This fast, non-destructive method allows us to identify contaminants that cause failures, verify material composition to ensure quality and compliance, and even support counterfeit detection by confirming a part’s authenticity. With EDS, we deliver clear, actionable insights that help you solve problems, improve reliability, and protect your products.